The application for the system to characterize the retardation films at different wavelength
Abstract: The paper reported a method to characterize the retardance of retardation films at different wavelength. The system is based on the method of rotation of quarter wave-plate. A spectrometer was sued as the light source ,color filters and a photodetector. We measured some samples using the system, analysed the measurement data, and obtained the spectrum characteristic of the retardation films. According to the theory of the system, the variation of the light source and other errors related to light intensity are not so critical for the measurement in this system. Furthermore, some quarter wave-plate’s affect for the other wavelength is very little, so the retardance is determined in a high accuracy and in a high repeatability. In principle, any retardance within the system accuracy can be measured.